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Probabilistic methods for reliability evaluation of combinational circuits
Authors
 Stempkovsky A.L.
 Telpukhov D.V.
 Soloviev Roman
 Telpukhova N.V.
Date of publication
 2017
Type of work
 статья в научном журнале
Library reference
 Stempkovsky A.L., Telpukhov D.V., Soloviev Roman, Telpukhova N.V. Probabilistic methods for reliability evaluation of combinational circuits. Проблемы разработки перспективных микро- и наноэлектронных систем (МЭС-2017). 2017. № 4. С. 41-44.
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