Stempkovsky A.L., Telpukhov D.V., Nadolenko V.V. Fast and Accurate Back Propagation Method for Reliability Evaluation of Logic Circuits. IEEE Conference of Russian Young Researchers in Electrical and Electronic Engineering (ElConRus). Saint Petersburg Electrotechn Univ LETI, RUSSIA, JAN 29-FEB 01, 2018. C. 1424-1429. DOI:10.1109/EIConRus.2018.8317364.