Home  Catalogue of authors Catalogue of works Full search Add papers Login

Test Chip for Identifying Spice-Parameters of Cryogenic BiFET Circuits
Authors
 Dvornikov O.V.
 Prokopenko N.N.
 Tchekhovski V.A.
 Galkin Ya.D.
 Kunts A.V.
 Bugakova A.V.
Date of publication
 2019
Type of work
 текст доклада на конференции
Library reference
 Dvornikov O.V., Prokopenko N.N., Tchekhovski V.A., Galkin Ya.D., Kunts A.V., Bugakova A.V. Test Chip for Identifying Spice-Parameters of Cryogenic BiFET Circuits. ESSDERC & ESSCIRC 2019, Proceedings of the ESSDERC 49th European Solid-State Device Research Conference. Cracow, Poland. 23–26 September, 2019. Pp. 102-105. DOI: 10.1109/ESSDERC.2019.8901773 (Scopus)
To IPPM site    To InfoMES site    Feedback
Copyright © 2012-2024 IPPM RAS. All Rights Reserved.
Updated and substantially revised version of system of 2016.
Design of site: IPPM RAS