Home  Catalogue of authors Catalogue of works Full search Add papers Login

New Metric for Evaluating the Effectiveness of Redundancy in Fault-Tolerant Logic Circuits
Authors
 Telpukhov D.V.
 Zhukova T.D.
Date of publication
 2021
Type of work
 текст доклада на конференции
Library reference
 Telpukhov D.V., Zhukova T.D. New Metric for Evaluating the Effectiveness of Redundancy in Fault-Tolerant Logic Circuits. 2021 IEEE East-West Design & Test Symposium (EWDTS). 2021. Pp. 1-6. doi: 10.1109/EWDTS52692.2021.9581027.
To IPPM site    To InfoMES site    Feedback
Copyright © 2012-2024 IPPM RAS. All Rights Reserved.
Updated and substantially revised version of system of 2016.
Design of site: IPPM RAS