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Logical timing analysis of digital IC reliability with NBTI and HCI degradation effects
Authors
 Gudkova O.N.
Date of publication
 2008
Type of work
 текст доклада на конференции
Library reference
 Gudkova O.N. Logical timing analysis of digital IC reliability with NBTI and HCI degradation effects. In Proc. of Moscow-Bavarian Joint Advanced Student School (MB-JASS). Moscow, 2008.
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