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Simulation of Total Dose Influence on Analog-Digital SOI/SOS CMOS Circuits with EKV-RAD macromodel
Authors
 Петросянц К.О.
 Самбурский Л.М.
 Харитонов И.А.
 Дрозденко Е.С.
 Поварницына З.М.
 Богатырев В.Н.
Date of publication
 2012
Type of work
 текст доклада на конференции
Library reference
 Петросянц К.О., Самбурский Л.М., Харитонов И.А., Дрозденко Е.С., Поварницына З.М., Богатырев В.Н. Simulation of Total Dose Influence on Analog-Digital SOI/SOS CMOS Circuits with EKV-RAD macromodel. Proc. of 10th IEEE East-West Design & Test Intl. Symposium (EWDTS'12). Kharkov, Ukraine, September 14-17, 2012. P. 60–65.
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