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Si BJT and SiGe HBT Performance Modeling after Neutron Radiation Exposure
Authors
 Petrosyants K.O.
 Vologdin E.N.
 Smirnov D.A.
 Torgovnikov R.A.
 Kozhukhov M.V.
Date of publication
 2011
Type of work
 текст доклада на конференции
Library reference
 Petrosyants K.O., Vologdin E.N., Smirnov D.A., Torgovnikov R.A., Kozhukhov M.V. Si BJT and SiGe HBT Performance Modeling after Neutron Radiation Exposure. Proc, of 9th IEEE East-West Design and Test Symposium (EWDTS2011). Sevastopol, Ukraine, Sept. 2011. Р. 267–274.
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