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Hardware-Software Subsystem for MOSFETs Characteristic Measurement and Parameter Extraction with Account for Radiation Effects
Authors
 Petrosyants K.O.
 Kharitonov I.A.
 Sambursky L.M.
Date of publication
 2013
Type of work
 статья в научном журнале
Library reference
 Petrosyants K.O., Kharitonov I.A., Sambursky L.M. Hardware-Software Subsystem for MOSFETs Characteristic Measurement and Parameter Extraction with Account for Radiation Effects. Advanced Materials Research. 2013. Vol. 718–720. Р. 750-755.
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