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Coupled TCAD-SPICE Simulation of Parasitic BJT Effect on SOI CMOS SRAM SEU
Authors
 Petrosyants K.O.
 Kharitonov I.A.
 Popov D.A.
Date of publication
 2013
Type of work
 текст доклада на конференции
Library reference
 Petrosyants K.O., Kharitonov I.A., Popov D.A. Coupled TCAD-SPICE Simulation of Parasitic BJT Effect on SOI CMOS SRAM SEU. Proceedings of IEEE East-West Design & Test Symposium (EWDTS’13). Kharkov: Kharkov national university of radioelectronics, 2013. P. 312-315.
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