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Temperature Characterization of Small-Scale SOI MOSFETs in the Extended Range (to 300°C)
Authors
 Petrosyants K.O.
 Lebedev S.V.
 Sambursky L.M.
 Stakhin V.G.
 Kharitonov I.A.
Date of publication
 2016
Type of work
 текст доклада на конференции
Library reference
 Petrosyants K.O., Lebedev S.V., Sambursky L.M., Stakhin V.G., Kharitonov I.A. Temperature Characterization of Small-Scale SOI MOSFETs in the Extended Range (to 300°C). Proc. of 22nd International Workshop on Thermal Investigations of ICs and Systems (THERMINIC). Budapest, Hungary. September 2016. Pp. 250-254.
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