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2021
		Yuchong Wang, Fanyu Liu, Bo Li, Binhong Li, Yang Huang, Can Yang, Junjun Zhang, Guoqing Wang, Jiajun Luo, Zhengsheng Han, Petrosyants K.O. Dependence of Temperature and Back-Gate Bias on Single-Event Upset Induced by Heavy Ion in 0.2-mkm DSOI CMOS Technology